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PMID: 12871818 已发表 · ppublish 英语

Laterally resolved EELS for ELNES mapping of the Fe L 2,3 - and O K-edge.

Ultramicroscopy ·第 96 卷 ·第 3-4 期 ·2003-11-05

Golla-Schindler U, Benner G, Putnis A

摘要

Nowadays fingerprinting techniques are well established for phase analysis. One of the common problems is the accurate calibration of the energy scale to compare the electron energy loss (ELNES) and to determine the energy shift precisely. One solution to this problem is laterally resolved electron energy loss spectroscopy (EELS), which involves orienting the specimen area or structure of interest, parallel to the energy dispersive direction and dispersing the intensity across the interface as a function of energy. This ELNES information can now be used to quantify and map changes in the electronic environment. The most critical instrumental performance for ELNES investigations is the available energy resolution, which for our instrument was estimated using the 0.5eV splitting of the Mn L(3)-edge of the mineral bixbyite. An ideal test sample for the ELNES investigations is a titanohematite, a solid solution between ilmenite (FeTiO(3)), with Fe in a divalent oxidation state, and hematite (Fe(2)O(3)) with Fe in a trivalent oxidation state. Using energy filtered imaging with a slit width of 4eV it is possible to map the Fe(2+)/Fe(3+) ratio as well as the near-edge structure of the O(K) signal and correlate these ELNES maps with a spatial resolution of a few nanometres. Quantitative compositional mapping on a nanometre scale was obtained by electron spectroscopic imaging. Quantitative point analyses also yield the chemical composition and the valence states. The precise knowledge of the energy shift and near edge structure enables us to select the characteristic ELNES structure and calculate jump ratio images. This yields quantitative valence state maps by using the Fe L(2,3)-edge, as well as phase maps by using the O K-edge.

文献信息
期刊
Ultramicroscopy
期刊简称
Ultramicroscopy
发表日期
2003-11-05
收录日期
2003-07-21
更新日期
2003-07-21
语言
英语
国家/地区
Netherlands
NLM ID
7513702
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