Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields.

Light, science & applications ·第 15 卷 ·第 1 期 ·2026-01-03

Wang B, Chen Q, Zuo C

摘要

A recent study employing high-spatial-resolution photoemission electron microscopy (PEEM) achieved, for the first time, weak-disturbance imaging of the ultra-confined nanoslit mode in a coupled nanowire pair (CNP), revealing its quasi-three-dimensional field distribution.

文献信息

期刊

Light, science & applications

期刊简称

Light Sci Appl

ISSN

2047-7538

DOI

10.1364/OPTICA.4.001437

通讯邮箱

[email protected]

发表日期

2026-01-03

语言

英语

国家/地区

England

NLM ID

101610753

外部链接

PubMed 原文 DOI: 10.1364/OPTICA.4.001437 查看期刊详情

分析服务

Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields.

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